Bachelorstudium in Wirtschaftsingenieurwesen Elektrotechnik und Informationstechnik


Transmission Electron Microscopes (TEM)

FEI Titan 80/300kV


Installed in 2007, out Titan is the state-of-the-art TEM & STEM facility for scientific work, education and service.

Main features are:

  • TEM resolution of 0.08nm
  • STEM resolution of 0.12nm
  • Imaging corrector (CEOS)
  • Gatan Tridiem imaging filter/spectrometer
  • Möllenstedt-Düker Biprism for electron holographic measurements
  • EDX Detector
  • STEM-detectors: High-angle annular dark field (fishione) for quantitative STEM, as well as ADF and Bright field detectors.
  • TEM/STEM tomography
  • Recording of images on either retractable or GIF CCD, each 2K x 2K or on Ditabis imaging plates
  • Facility for plasma cleaning (Binder) in the direct vicinity

Philips CM 20

This Microscope is mainly used for diffraction, practicals and service work. Users of foreign institutes may eventually access this facility after a short course.

It is equipped with an LaB6 cathode and an Ultra Twin objective lens (Cs = 0.5mm).

Focussed Ion Beam (FIB)

FEI, Nova 200

Scanning Electron Microscope (SEM)

Zeiss, Auriga

Name Phone Room
Chemielabor 62258 N4170
CM20-Labor 62264 O0090
Computer Cluster 62257 N4365
REM-Labor AURIGA 62584 O0080
Ditabis 62256 N4370
Elektronik-Werkstatt 62260 N4150
FIB/Technologie 2 3605 M0040
Fotolabor / Vakuum-Exsikkator --- O0100
Präparationslabor PIPS 62259 N4160
Titan-Labor 4536 O0050